Benchmark Technologies’
Custom Services

I
n addition to designing and supplying state-of-the-art test reticles, Benchmark Technologies provides specialized services to support your lithography, metrology, design, and applications efforts:
  • Custom reticle design
  • Wafer design services
  • Wafer foundry services
  • Metrology equipment calibration
  • Quick-turn data procurement
  • Consultation on reticle strategies, materials, and processes
  • Development of customized test and evaluation reticles
  • Full support for our reticles and their associated applications
  • CAD services related to reticle design
  • Data Translation for Optical Proximity Correction (OPC)
  • Mask services
 
    • Data procurement
    • CAD servcies
    • Verification services
    • Continuity checks
    • VIA tests
  • Calibration Standards (rulers, resolution targets,etc.) for SEM and Microscope Stage/Magnification calibration
   

Contact us for more information about Custom Services.

 
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